2012 ©
             Publication
Journal Publication
Title of Article Shrinking Size Effects of CPP-TMR and CPP-GMR Heads: Failure Phenomena Caused by Electrostatic Discharge 
Date of Acceptance 15 March 2012 
Journal
     Title of Journal KKU Research Journal 
     Standard  
     Institute of Journal Khon Kaen University 
     ISBN/ISSN  
     Volume  
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     Year of Publication 2012 
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     Abstract This work presents the tolerance of CPP-TMR and CPP-GMR heads to ESD events when the sizes of both reader technologies are shrinking. The shrinking size effect actually indicates the growth of AD targeting to Tb/in2. Blocking temperature, melting temperature,and electric field breakdown of the oxide layer are the key parameters for investigation upon the temperature increment of CPP-TMR and CPP-GMR heads caused by an ESD current. The investigation was carried out by using a finite element analysis, solver and simulation software. The results reveal that at 30% shrinking size, CPP-TMR is 15% less tolerance to ESD phenomena than that of CPP-GMR technology for the case of hard failure aspect. On the other hand, CPP-GMR is approximately 10% more sensitive to ESD events than CPP-TMR technology for the case of soft failure aspect. 
     Keyword magnetoresistance, current perpendicular, electrostatic discharge, shrinking, failure 
Author
525040001-6 Miss KANUENGNIT MARONGMUED [Main Author]
Engineering Master's Degree

Reviewing Status มีผู้ประเมินอิสระ 
Status ได้รับการตอบรับให้ตีพิมพ์ 
Level of Publication ชาติ 
citation true 
Part of thesis true 
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