| Research Title |
Effect of Voltage Pattern on Intensity of Electromagnetic Emission during Electric Flame-Off Process of Ball Bonding Machine |
| Date of Distribution |
13 October 2011 |
| Conference |
| Title of the Conference |
The 2nd International Conference on Advances in Materials and Manufacturing Processes |
| Organiser |
Hong Kong Industrial Technology Research Centre |
| Conference Place |
Guilin DaZheng Hot Spring Holiday Hotel |
| Province/State |
Guilin |
| Conference Date |
16 December 2011 |
| To |
18 December 2011 |
| Proceeding Paper |
| Volume |
2011 |
| Issue |
418-420 |
| Page |
2265-2271 |
| Editors/edition/publisher |
|
| Abstract |
Electromagnetic interference (EMI) can degrade device performance, particularly a sensitive device such as magnetic recording heads. A high applied voltage generates a high electric field in order to break the electrical air gap during a gold ball bonding process. This work, for the first time, investigates the influence of high voltage pattern of a gold ball bond machine on both electric field and magnetic field as an electromagnetic wave by monitoring an intensity of electromagnetic interference. The investigation was carried out by simulation of a live gold ball bond machine operation by using a finite integral technique. The simulation results reveal that the voltage pattern plays an important role in the intensity of electromagnetic radiation (EMR). In conclusion, an ideal voltage pulse of 2 kV and 4 kV generates the highest EMR detected by a monopole antenna. The induced voltage occuring at the antenna reflecting the intensity of EMI blasting was as high as 33.39 V and 71.36 V, respectively. Smoothening the voltage pattern by incrasing the rise time of voltage to 100 ns only, the induced voltage at the antenna was reduced down to 99.90% and 99.92% compairing with the case of an ideal voltage pulse for the peak EFO voltage of 2 kV and 4kV respectively. This concludes the importance of the voltage pattern during a free air ball forming process; hence lowering the risk of the highly sensitive deivce to be damaged by EMI blasting. |
| Author |
|
| Peer Review Status |
มีผู้ประเมินอิสระ |
| Level of Conference |
นานาชาติ |
| Type of Proceeding |
Full paper |
| Type of Presentation |
Oral |
| Part of thesis |
true |
| ใช้สำหรับสำเร็จการศึกษา |
ไม่เป็น |
| Presentation awarding |
false |
| Attach file |
|
| Citation |
0
|
|
|
Publication
Journal Publication
ไทย