| Research Title |
How Does Electrostatic Discharge Event Not Cause Polarity Flip in TMR Read Heads? |
| Date of Distribution |
10 May 2012 |
| Conference |
| Title of the Conference |
the International Magnetics Conference, INTERMAG 2012 |
| Organiser |
The Magnetics Society of the Institute of Electrical and Electronics Engineers (IEEE) |
| Conference Place |
Vancouver |
| Province/State |
Canada |
| Conference Date |
7 May 2012 |
| To |
11 May 2012 |
| Proceeding Paper |
| Volume |
2012 |
| Issue |
- |
| Page |
- |
| Editors/edition/publisher |
|
| Abstract |
Electrostatic Discharge (ESD) current causes both soft and hard failures on GMR read head technology; however, the current head technology such TMRs, the soft failure phenomenon such magnetization reversal has not been well understood. The previuos published work only state that the soft failure does not occur on TMR technology; however nonhas pinpointed the cause a magnetization reversal on TMR read head instead ESD event likely induces only hard failure on TMRs. The explanation of this mechanism was conducted by investigating the important parameters such as Blocking temperature (TB), Neel temperature (TN), Curie temperature (TC), and Electric Field Breakdown (EB) of a particular TMR head were mornitored while an ESD current being applied by using Finite Element simulator. The results reveal that the oxide breakdown at the insulator layer occurs at a lower level of ESD current; for example this particular TMR head the oxide breakdown occurs at ESD peak current of 4 mA while it requires 6 mA to causes a magnetization reversal. |
| Author |
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| Peer Review Status |
มีผู้ประเมินอิสระ |
| Level of Conference |
นานาชาติ |
| Type of Proceeding |
Abstract |
| Type of Presentation |
Oral |
| Part of thesis |
true |
| Presentation awarding |
false |
| Attach file |
|
| Citation |
0
|
|
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Publication
Journal Publication
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