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Publication
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| Title of Article |
Shrinking Size Effects of CPP-TMR and CPP-GMR Heads: Failure Phenomena Caused by Electrostatic Discharge |
| Date of Acceptance |
15 March 2012 |
| Journal |
| Title of Journal |
KKU Research Journal |
| Standard |
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| Institute of Journal |
Khon Kaen University |
| ISBN/ISSN |
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| Year of Publication |
2012 |
| Page |
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| Abstract |
This work presents the tolerance of CPP-TMR and CPP-GMR heads to ESD events
when the sizes of both reader technologies are shrinking. The shrinking size effect actually indicates the growth of AD targeting to Tb/in2. Blocking temperature, melting temperature,and electric field breakdown of the oxide layer are the key parameters for investigation upon the temperature increment of CPP-TMR and CPP-GMR heads caused by an ESD current. The investigation was carried out by using a finite element analysis, solver and
simulation software. The results reveal that at 30% shrinking size, CPP-TMR is 15% less tolerance to ESD phenomena than that of CPP-GMR technology for the case of hard failure aspect. On the other hand, CPP-GMR is approximately 10% more sensitive to ESD events than CPP-TMR technology for the case of soft failure aspect. |
| Keyword |
magnetoresistance, current perpendicular, electrostatic discharge, shrinking, failure |
| Author |
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| Reviewing Status |
มีผู้ประเมินอิสระ |
| Status |
ได้รับการตอบรับให้ตีพิมพ์ |
| Level of Publication |
ชาติ |
| citation |
true |
| Part of thesis |
true |
| ใช้สำหรับสำเร็จการศึกษา |
ไม่เป็น |
| Attach file |
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| Citation |
0
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Journal Publication
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