2012 ©
             Publication
Journal Publication
Title of Article Effects of Mg2þ doping ions on giant dielectric properties and electrical responses of Na1/2Y1/2Cu3Ti4O12 ceramics 
Date of Acceptance 26 July 2016 
Journal
     Title of Journal Ceramics International 
     Standard SCOPUS 
     Institute of Journal Elsevier Ltd. 
     ISBN/ISSN  
     Volume  
     Issue 42 
     Month
     Year of Publication 2017 
     Page 16287–16295 
     Abstract Influences of Mg2þ doping ions on electrical and giant dielectric properties of Na1/2Y1/2Cu3-xMgxTi4O12 (x¼0–0.3) ceramics prepared by a conventional solid state reaction method were systematically studied. Mg2þ doping ions were homogeneously dispersed in the microstructure and caused a large increase in the mean grain size from 11.0 to 88.4 mm as Mg2þ concentration was increased from x¼0 to 0.3. This resulted in a reduction of the breakdown voltage (from 3002 to 537 V cm2) and nonlinear coefficient (from 6.79 to 5.40), indicating the importance of microstructure in controlling the nonlinear current– voltage properties of Na1/2Y1/2Cu3Ti4O12. The grain and grain boundary responses were characterized by admittance and impedance spectroscopy analyses, respectively. X–ray absorption near edge structure and X–ray photoelectron analyses confirmed the presence of Cuþ, Cu3þ, and Ti3þ ions in Na1/2Y1/ 2Cu3xMgxTi4O12 ceramics, indicating the complex mechanisms of conduction exist inside the grains. Substitution of Mg2þ resulted in a small decrease in conduction inside the grains, which may primarily be attributed to the reduction of the Ti3þ concentration. Reduced loss tangent (E0.036) and enhanced permittivity (E2.02  104) with better temperature stability were achieved in the Na1/2Y1/ 2Cu2.9Mg0.1Ti4O12 ceramic compared to the undoped sample. The dielectric relaxation behavior can be well described using the Maxwell–Wagner relaxation model based on the internal barrier layer capacitor structure. 
     Keyword Giant dielectric properties Spectroscopy, X–ray absorption near edge structure, X–ray photoelectron spectroscopy, Maxwell–Wagner polarization, CCTO 
Author
577020051-2 Mr. JUTAPOL JUMPATAM [Main Author]
Science Doctoral Degree

Reviewing Status มีผู้ประเมินอิสระ 
Status ตีพิมพ์แล้ว 
Level of Publication นานาชาติ 
citation true 
Part of thesis true 
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