| Research Title |
Enhanced dielectric and non-Ohmic properties in CaCu3Ti4O12/CaTiO3 nanocomposites prepared by a chemical combustion method |
| Date of Distribution |
15 June 2018 |
| Conference |
| Title of the Conference |
Collaborative Conference on 3D and Materials Research (CC3DMR) 2015 |
| Organiser |
Open-Access house of Science and Technology (OAHOST) |
| Conference Place |
Bexco |
| Province/State |
Busan/South Korea |
| Conference Date |
15 June 2016 |
| To |
19 June 2016 |
| Proceeding Paper |
| Volume |
- |
| Issue |
- |
| Page |
- |
| Editors/edition/publisher |
|
| Abstract |
Recently, CaCu3Ti4O12 (CCTO) has been intensively investigated to improve dielectric properties for practical applications such as capacitor and memory devices. CCTO can exhibit a high dielectric constant () of about 103-105 [1-3]. Unfortunately, the loss tangent (tan) is still too large, which is one of the most serious problems preventing the use of CCTO in capacitor applications [1-3]. Largely reduced tan (~0.02) was achieved in the CCTO/CaTiO3 (CCTO/CTO) composite system prepared by a conventional solid state reaction method, while its value was found to be ~1800 at 1 kHz [4]. In this work, CCTO/CTO nanocomposites were prepared by a chemical combustion method using one-step processing route. Phase compositions were characterized by an X-ray diffraction (XRD) technique, confirming the existence of CCTO and CTO phases. Nanoparticles of CCTO and CTO were revealed by transmission electron microscope (TEM). The microstructure of the sintered ceramic nanocomposites was characterized by scanning electron microscope (SEM) and energy dispersive spectroscopy (EDS) technique. Dense ceramic microstructure of the CCTO/CTO nanocomposites was obtained. Interestingly, as shown in Fig. 1, the sintered CCTO/CTO ceramics exhibit high values of about 103104 in a low frequency range. An impedance spectroscopy was used to describe the electrical responses of internal interfaces. Non-Ohmic properties were also investigated. The dielectric properties and non-Ohmic behavior can be well described by the electrical responses of internal interfaces. |
| Author |
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| Peer Review Status |
ไม่มีผู้ประเมินอิสระ |
| Level of Conference |
นานาชาติ |
| Type of Proceeding |
Abstract |
| Type of Presentation |
Poster |
| Part of thesis |
true |
| Presentation awarding |
false |
| Attach file |
|
| Citation |
0
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Publication
Journal Publication
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