| Research Title |
The Computational Simulation of FICBE Test Bench Using Transient
Analysis Technique |
| Date of Distribution |
27 November 2019 |
| Conference |
| Title of the Conference |
International Conference on Communication, Electronics and Electrical Engineering (ICCEEE) |
| Organiser |
INTERNATIONAL SOCIETY FOR SCIENTIFIC RESEARCH AND DEVELOPMENT |
| Conference Place |
Tokyo Bay Ariake Washington Hotel |
| Province/State |
Tokyo, Japan |
| Conference Date |
27 November 2019 |
| To |
27 November 2019 |
| Proceeding Paper |
| Volume |
- |
| Issue |
- |
| Page |
- |
| Editors/edition/publisher |
|
| Abstract |
This work reports the computational simulation of the test-bench prototype for (Field Induced Charge Board Event) FICBE using the transient analysis technique. The discharge probe and its stray impedance had been simulated using RLC circuit analyzed in transient mode. The simulation revealed that the stray impedance could distort FICBE discharge current, which is very high peak current, fast rise time waveform, and lead the non-compliant in test bench qualification. In addition, the adding of a ferrite bead could shape the discharge current to meet the standard waveform requirement. These findings are beneficial to the FICBE test bench design guideline to meet the waveform qualification accurately. |
| Author |
|
| Peer Review Status |
มีผู้ประเมินอิสระ |
| Level of Conference |
นานาชาติ |
| Type of Proceeding |
Full paper |
| Type of Presentation |
Oral |
| Part of thesis |
true |
| Presentation awarding |
false |
| Attach file |
|
| Citation |
0
|
|
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Publication
Journal Publication
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