2012 ©
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Journal Publication
Title of Article Temperature stability of the dielectric properties of Zr4+-doped CaCu3Ti4.2O12 ceramics for X9R capacitor applications 
Date of Acceptance 6 March 2019 
Journal
     Title of Journal Journal of Alloys and Compounds 
     Standard SCOPUS 
     Institute of Journal Elsevier 
     ISBN/ISSN  
     Volume 789 
     Issue  
     Month June
     Year of Publication 2019 
     Page 231-239 
     Abstract In the present work, a giant dielectric constant (ε′) ∼ 11672 was developed in a CaCu3Ti4.15Zr0.05O12 ceramic with a very low loss tangent (tanδ) ∼ 0.011 at 30 °C and 1 kHz over a temperature range of −60 °C to 110 °C. The resulting dielectric variation (Δε') < ±15% over a temperature range of −60 °C to 210 °C, as well as good nonlinear properties (α ∼ 24.23 and Eb ∼ 8.37 kV cm−1) were achieved in a CaCu3Ti4.15Zr0.05O12 ceramic sintered at 1080 °C for 8 h. According to the EIA standard, this ceramic's excellent dielectric and nonlinear properties provide for potential applications in X9R capacitors and varistors. Very high performance dielectric and nonlinear electrical properties are suggested to have originated from the very high grain boundary resistance (RGB ∼ 515.5 kΩ cm). This was a result of a TiO2-rich environment at the grain boundaries and Zr4+ doping. The grain resistance (RG) and grain boundary resistance (RGB) were studied using impedance spectroscopy. Backscatter FESEM images with elemental mapping and XRD results confirmed the presence of mixed phases of TiO2 and CaCu3Ti4O12. 
     Keyword X9R capacitorCaCu3Ti4.2-xZrxO12 ceramicsDielectric propertiesNon-ohmic properties 
Author
587020070-5 Mr. KRISSANA PROMPA
Science Doctoral Degree

Reviewing Status มีผู้ประเมินอิสระ 
Status ตีพิมพ์แล้ว 
Level of Publication นานาชาติ 
citation true 
Part of thesis true 
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