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Publication
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| Title of Article |
Computational Simulation of a Field-Induced Charged Board Event Test Bench Using Transient Analysis |
| Date of Acceptance |
5 June 2023 |
| Journal |
| Title of Journal |
IEEE Access |
| Standard |
ISI |
| Institute of Journal |
IEEE |
| ISBN/ISSN |
- |
| Volume |
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| Issue |
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| Month |
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| Year of Publication |
2023 |
| Page |
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| Abstract |
This study reported the computational simulation of a test bench prototype for a field-induced charged board event (FICBE) by using transient analysis. The discharge probe and its stray impedance were experimentally measured using an RLC circuit analyzed in the transient mode. The simulation revealed that the stray impedance could distort the FICBE discharge current waveform, which is very-high-peak-current, fast-rise-time waveform, and leads to noncompliance in test bench qualification. Furthermore, adding a ferrite bead could shape the discharge current to satisfy the standard waveform requirement. These findings could provide considerable insights for designing a FICBE test bench that satisfies waveform qualification requirements.
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| Keyword |
Field-induced, Charged Board Model, Charged Board Event, and Circuit Simulation |
| Author |
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| Reviewing Status |
มีผู้ประเมินอิสระ |
| Status |
ได้รับการตอบรับให้ตีพิมพ์ |
| Level of Publication |
นานาชาติ |
| citation |
false |
| Part of thesis |
true |
| Attach file |
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| Citation |
0
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Journal Publication
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