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Publication
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Title of Article |
Effect of Voltage Pattern on Intensity of Electromagnetic Emission during Electric Flame-Off Process of Ball Bonding Machine |
Date of Acceptance |
13 October 2011 |
Journal |
Title of Journal |
Advanced Materials Research |
Standard |
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Institute of Journal |
Hong Kong Industrial Technology Research Centre |
ISBN/ISSN |
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Volume |
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Issue |
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Month |
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Year of Publication |
2012 |
Page |
2265-2271 |
Abstract |
Electromagnetic interference (EMI) can degrade device performance, particularly a sensitive device such as magnetic recording heads. A high applied voltage generates a high electric field in order to break the electrical air gap during a gold ball bonding process. This work, for the first time, investigates the influence of high voltage pattern of a gold ball bond machine on both electric field and magnetic field as an electromagnetic wave by monitoring an intensity of electromagnetic interference. The investigation was carried out by simulation of a live gold ball bond machine operation by using a finite integral technique. The simulation results reveal that the voltage pattern plays an important role in the intensity of electromagnetic radiation (EMR). In conclusion, an ideal voltage pulse of 2 kV and 4 kV generates the highest EMR detected by a monopole antenna. The induced voltage occuring at the antenna reflecting the intensity of EMI blasting was as high as 33.39 V and 71.36 V, respectively. Smoothening the voltage pattern by incrasing the rise time of voltage to 100 ns only, the induced voltage at the antenna was reduced down to 99.90% and 99.92% compairing with the case of an ideal voltage pulse for the peak EFO voltage of 2 kV and 4kV respectively. This concludes the importance of the voltage pattern during a free air ball forming process; hence lowering the risk of the highly sensitive deivce to be damaged by EMI blasting. |
Keyword |
Electromagnetic Interference (EMI), Electromagnetic Radiation (EMR), Electric Field, Ball Bonding process, Electric Flame-Off (EFO), High Voltage, Sharp Voltage Rise, dV/dt, Rise Time, Finite Integral Technique |
Author |
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Reviewing Status |
มีผู้ประเมินอิสระ |
Status |
ตีพิมพ์แล้ว |
Level of Publication |
นานาชาติ |
citation |
false |
Part of thesis |
true |
Attach file |
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Citation |
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