| Research Title |
Shrinking Size Effects of TMR and CPP-GMR Heads: Failure Phenomena Caused by Electrostatic Discharge Aspects |
| Date of Distribution |
9 January 2012 |
| Conference |
| Title of the Conference |
The 4th International Data Storage Technology Conference |
| Organiser |
The Board of Investment of Thailand (BOI), National Science and Technology Development Agency (NSTDA), Hard Disk Drive Institute (HDDI), I/U CRC in HDD Component |
| Conference Place |
IMPACT Convention Center (Hall 9) Muangthong Thani |
| Province/State |
Nonthaburi |
| Conference Date |
9 January 2012 |
| To |
10 January 2012 |
| Proceeding Paper |
| Volume |
2011 |
| Issue |
- |
| Page |
252-255 |
| Editors/edition/publisher |
|
| Abstract |
This work presents the tolerance of TMR and CPP-GMR heads to ESD events when the sizes of both reader technologies are shrinking. The shrinking size effect actually indicates the growth of AD targeting to Tb/in2. Blocking temperature, melting temperature, and electric field breakdown of the oxide layer are the key parameters for investigation upon the temperature increment of TMR and CPP-GMR heads caused by ESD current. The investigation was carried out by using a finite element analysis, solver and simulation software. The results reveal that at 30% shrinking size, TMR is 15% less tolerance to ESD phenomena than CPP-GMR technology for the case of hard failure. On the other hand, CPP-GMR is approximately 10% more sensitive to ESD event than TMR technology for the case of soft failure case. |
| Author |
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| Peer Review Status |
มีผู้ประเมินอิสระ |
| Level of Conference |
นานาชาติ |
| Type of Proceeding |
Full paper |
| Type of Presentation |
Oral |
| Part of thesis |
true |
| ใช้สำหรับสำเร็จการศึกษา |
ไม่เป็น |
| Presentation awarding |
false |
| Attach file |
|
| Citation |
0
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Publication
Journal Publication
ไทย