2012 ©
             Publication
Journal Publication
Research Title The Proof of fake jewelry by Scanning Electron Microscope (SEM)and Fourier Transform infrared Spectrophotometer (FTIR) 
Date of Distribution 19 January 2018 
Conference
     Title of the Conference The 4th Management and Innovation Technology International Conference (MITiCON2017) 
     Organiser Thai-Nichi Institute of Technology 
     Conference Place Classic Kameo Ayuttaya Hotel 
     Province/State อยุธยา 
     Conference Date 14 December 2017 
     To 16 December 2017 
Proceeding Paper
     Volume
     Issue
     Page 62 
     Editors/edition/publisher
     Abstract Thailand has the export value of gems and jewelry as the third most important export product of Thailand's total exports. The production of counterfeit jewelry was distributed to many markets to meet the market. Create problems for investigation and investigation of officials. The research aim, to investigate the difference between fake jewelry and genuine jewelry types with Scanning electron microscope (SEM) and Fourier Transform Infrared Spectrophotometer (FTIR). In the trial 12 samples of genuine jewelry and fake jewelery type Jade, Sapphire and Ruby tested by Scanning electron microscope (SEM) with the Energy Dispersive X-Ray Spectrometer, fake jewelry and genuine jewelry the appearance of the surface and trace elements are distintly different. Samples of jewelry and fake jewelry were analyzed with a Fourier Transform Infrared Spectrophotometer (FTIR) at 4000-600 cm-1, the spectra of fake jewelry and genuine jewelry made of all samples were different and some sample were similar. Due to some elements, the substance in both jewelry samples partly similar. However, peaks can indicate the composition of jewelry.This study found analysis of jewelry with Scanning electron microscope (SEM) with Energy Dispersive X-Ray Spectrometer can be used to distinguish between genuine and fake jewelry. The method is easy, easy to analyze. It also provides accurate and accurate analytical results can applied in forensic science. Keywords—Scanning electron microscope (SEM) , Fourier Transform Infrared Spectrophotometer (FTIR),Jewelry, Jade, Sapphire, Ruby  
Author
565020218-7 Mrs. MUTJARIN SOUVANH [Main Author]
Science Master's Degree

Peer Review Status ไม่มีผู้ประเมินอิสระ 
Level of Conference นานาชาติ 
Type of Proceeding Full paper 
Type of Presentation Poster 
Part of thesis true 
Presentation awarding false 
Attach file
Citation 0